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Germany – Machines and apparatus for testing and measuring – Semi-Automatic Wafer Prober System for Characterization of 200-mm Wafers

IHP GmbH - Lebniz-Institut für innovative Mikroelektronik

Estimated value
—
Submission deadline
29 Oct 202612:00, Brussels time
Procedure
Open procedure
CPV
38540000Machines and apparatus for testing and measuring
Published
29 Sept 2026TED

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