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Denmark – Scanning electron microscopes – The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source

Danmarks Tekniske Universitet - DTU

Open procedure by Danmarks Tekniske Universitet - DTU, bids due 16 Nov 2026.

Estimated value
—
Submission deadline
16 Nov 202608:00, Brussels time
Procedure
Open procedure
CPV
38511100Scanning electron microscopes ; Electron microscopes ; Ion microscopes
Published
15 Oct 2026TED
Official notice

How contested it usually is

Based on 3 contracts in the same sector awarded by this buyer in the last 3 years. Small sample: indicative only.

—bidders per lot, median
—of lots had a single bid
—below the estimate, median discount

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